Description: Ultrasonic microscope, the English name is Scanning Acoustic Tomography, referred to as SAT. Ultrasonic microscope analysis is a non-destructive testing method, widely used in material testing (IQC), failure analysis (FA), quality control (QC), quality assurance and reliability (QA/REL), research and development (R&D) and other fields. Detect defects such as delamination and cracks of electronic components, LEDs, and metal substrates (cracks, delaminations, voids, etc.); use image contrast to identify differences in internal acoustic impedance of materials, determine the shape and size of defects, and determine the orientation of defects, etc.


Ultrasonic scanning microscope, its characteristics are as follows:


1: Non-destructive and non-destructive testing of the internal packaging of the sample;


2: There is no special requirement for the sample when testing, and the sample surface can be tested evenly;


3: Intuitive image and analysis;


4: Harmless to samples and human body;


We has been equipped with low-frequency 15MHz, 30MHz, 40MHz, 75MHz, high-frequency 100MHz, 230MHz and other probes, which can meet DIP, PLCC, TO, QFP, BGA, SOP, SOT, QFN, TQFP, DFN, Flip Chip , WLCSP and other integrated circuits and PCB inspections in different packages.